Our areas of expertise include:

· High performance scientific computing
· Numerical problems
· Implementation & verification of algorithms
· Code performance optimization
· Selection, evaluation & adoption of commercial codes
· Hardware selection & performance tuning
· FORTRAN

· Computational Electromagnetics
· Computational Fluid Dynamics
· Multi-stage Monte Carlo Methods,
  Super-Particle & Particle-In-Cell Methods, DSMC

· Electron-optics and ion-optics simulations
· Full wave optics, X-ray diffraction simulation
· Large PDEs problems, large equation systems
· Finite Difference Methods, Finite Element Methods,
  Finite Difference Time Domain
· Navier Stokes solver, Laplace & Poisson solver,
  Maxwell solver, Newtonian motion solver
· Data filtering in time and frequency domain, noise suppression, FFT
· n-dimensional data interpolation and curve fitting, prediction
· Large scale particle tracing
· Computation of population statistics
· High-dimensional optimization

Specific applications include:

· Scientific Instrumentation for Life Science and Nanotech
· X-ray diffraction (XRD) and X-ray scattering on nano-scale systems
· XRD indexing
· Near-field optics, evanescent wave sensing
· Optical sensing of biological nano-scale layers or biochemical reactions
  (wave guides, interferometry)
· Liquid Crystals

· Design and measurement of electric and magnetic fields
· Parasitics in Integrated Circuits and MEMs
  (capacitance and inductance)
· Electron beam and ion beam systems; magnetrons
· Electric and magnetic lenses,
· Electric and magnetic deflection systems
· Ion beam and electron beam generation

· Mass spectrometry on organic and inorganic matter
· Ion sources for biomolecules,
· Laser Desorption and Ionization
· Rarified gas dynamics
· Simulation and Design of advanced vacuum systems
· Collisional ion cooling
· Ion traps and guides

· Data aquisition and data processing
· Noise suppression
· Image and Video processing, real-time data extraction
· Advanced electronics
· Thermal problems, incl. highly accurate stabilization
· Interferometry, Ellisometry, EvaSens WIOS,
  SEM, TEM, Lithography, AFM, XFS, DSC